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High-resolution AES analysis and imaging of In-80Sn oxidized surface using field emission auger microprobe

Identifieur interne : 00D373 ( Main/Repository ); précédent : 00D372; suivant : 00D374

High-resolution AES analysis and imaging of In-80Sn oxidized surface using field emission auger microprobe

Auteurs : RBID : Pascal:03-0337852

Descripteurs français

Pascal (Inist)
- Etude expérimentale, Couche mince, Alliage binaire, Alliage base étain, Indium alliage, Traitement thermique, Oxydation, Morphologie, Couche superficielle, Composition chimique, Spectrométrie Auger, Haute résolution, 7920F, 6835D, Alliage In81Sn19, In Sn.

English descriptors

KwdEn :
- AES, Binary alloys, Chemical composition, Experimental study, Heat treatments, High-resolution methods, Indium alloys, Morphology, Oxidation, Surface layers, Thin films, Tin base alloys.

Abstract

In this study, for the first time, it is shown how the heating of an in-80Sn alloy affects its morphology and surface chemical composition. The study of the initial phases of surface oxidation of the pure In-80Sn alloy at room temperature revealed the formation of a mixture of In₂O₃, SnO and SnO₂ oxides with a dominant contribution of In₂O₃. The high spatial resolution of the Auger spectrometer enabled us to examine the fine details at various spots on the surface. The results vary from one point of analysis to another. The statistical analysis of a large number of spectra shows clearly an enrichment in the In content in both oxide layer and the clean sample obtained after the oxide layer is removed by heating the sample at 400°C. The thickness of the oxide layer, approximately 3.5 nm, was estimated by AES depth profiling analysis.

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Pascal:03-0337852

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<author><name sortKey="Jenko, M" uniqKey="Jenko M">M. Jenko</name>
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<country>Slovénie</country>
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<author><name sortKey="Erjavec, B" uniqKey="Erjavec B">B. Erjavec</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Institute of Metals and Technology, University of Ljubljana, Lepi pot 11</s1>
<s2>Ljubljana 1000</s2>
<s3>SVN</s3>
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<country>Slovénie</country>
<wicri:noRegion>Ljubljana 1000</wicri:noRegion>
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<author><name sortKey="Milun, M" uniqKey="Milun M">M. Milun</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Institute of Metals and Technology, University of Ljubljana, Lepi pot 11</s1>
<s2>Ljubljana 1000</s2>
<s3>SVN</s3>
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<sZ>2 aut.</sZ>
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<country>Slovénie</country>
<wicri:noRegion>Ljubljana 1000</wicri:noRegion>
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<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Institute of Physics, P.O. Box 304</s1>
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<term>Indium alloys</term>
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<term>Oxidation</term>
<term>Surface layers</term>
<term>Thin films</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Etude expérimentale</term>
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<front><div type="abstract" xml:lang="en">In this study, for the first time, it is shown how the heating of an in-80Sn alloy affects its morphology and surface chemical composition. The study of the initial phases of surface oxidation of the pure In-80Sn alloy at room temperature revealed the formation of a mixture of In<sub>2</sub>
O<sub>3</sub>
, SnO and SnO<sub>2</sub>
 oxides with a dominant contribution of In<sub>2</sub>
O<sub>3</sub>
. The high spatial resolution of the Auger spectrometer enabled us to examine the fine details at various spots on the surface. The results vary from one point of analysis to another. The statistical analysis of a large number of spectra shows clearly an enrichment in the In content in both oxide layer and the clean sample obtained after the oxide layer is removed by heating the sample at 400°C. The thickness of the oxide layer, approximately 3.5 nm, was estimated by AES depth profiling analysis.</div>
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O<sub>3</sub>
, SnO and SnO<sub>2</sub>
 oxides with a dominant contribution of In<sub>2</sub>
O<sub>3</sub>
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High-resolution AES analysis and imaging of In-80Sn oxidized surface using field emission auger microprobe

High-resolution AES analysis and imaging of In-80Sn oxidized surface using field emission auger microprobe

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

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Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

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